A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging” was published by researchers at Arizona State University. “Fan-out ...

SANTA CLARA, Calif. (USA) & BANGALORE, India – February 24, 2011 – SoftJin Technologies, a provider of customized automation software for Electronic Design and Manufacturing, today announced the ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult ...

The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...

With the aim of accelerating yield ramps of deep sub-micron semiconductors by speeding root cause analysis of defects to give better control over advanced processes, reduced time-to-market, and lower ...

SoftJin, a provider of Customized Automation software for Electronic Design and Manufacturing, announces NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The ...

Every enterprise struggles to combat some ingrained partialities but, after 23 years in the QA industry, I’ve found that there’s a particular pattern of bias against static testing. It’s no industry ...